2014, ISBN: 9783319028743
FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an im… Mehr…
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2014, ISBN: 9783319028743
FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an im… Mehr…
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ISBN: 9783319028743
Materials Science; Nanotechnology; Semiconductors; Nanotechnology and Microengineering; Nanochemistry; Nanoscale Science and Technology; Optical and Electronic Materials AFM Cantilever Ca… Mehr…
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2014, ISBN: 9783319028743
Lecture Notes in Nanoscale Science and Technology, eBooks, eBook Download (PDF), Auflage, [PU: Springer-Verlag], [ED: 1], Springer-Verlag, 2014
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2014, ISBN: 9783319028743
eBooks, eBook Download (PDF), 2013, [PU: Springer International Publishing], Springer International Publishing, 2014
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2014, ISBN: 9783319028743
FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an im… Mehr…
2014, ISBN: 9783319028743
FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an im… Mehr…
ISBN: 9783319028743
Materials Science; Nanotechnology; Semiconductors; Nanotechnology and Microengineering; Nanochemistry; Nanoscale Science and Technology; Optical and Electronic Materials AFM Cantilever Ca… Mehr…
2014, ISBN: 9783319028743
Lecture Notes in Nanoscale Science and Technology, eBooks, eBook Download (PDF), Auflage, [PU: Springer-Verlag], [ED: 1], Springer-Verlag, 2014
2014, ISBN: 9783319028743
eBooks, eBook Download (PDF), 2013, [PU: Springer International Publishing], Springer International Publishing, 2014
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Detailangaben zum Buch - FIB Nanostructures
EAN (ISBN-13): 9783319028743
Erscheinungsjahr: 2014
Herausgeber: Springer-Verlag
Buch in der Datenbank seit 2015-08-06T01:58:29+02:00 (Berlin)
Detailseite zuletzt geändert am 2022-04-20T14:26:42+02:00 (Berlin)
ISBN/EAN: 9783319028743
ISBN - alternative Schreibweisen:
978-3-319-02874-3
Daten vom Verlag:
Autor/in: Zhiming M. Wang
Titel: Lecture Notes in Nanoscale Science and Technology; FIB Nanostructures
Verlag: Springer; Springer International Publishing
530 Seiten
Erscheinungsjahr: 2014-01-04
Cham; CH
Sprache: Englisch
149,79 € (DE)
154,00 € (AT)
177,00 CHF (CH)
Available
XIII, 530 p. 375 illus., 200 illus. in color.
EA; E107; eBook; Nonbooks, PBS / Technik/Maschinenbau, Fertigungstechnik; Nanotechnologie; Verstehen; AFM Cantilever Calibration; Agmicro-Nanostructures; Deterministic Fabrication of Nanostructures FIB; Epitaxial Ferroelectric Nanostructures; FIB; FIB Fabrication Semiconductor Nanostructures; FIB Induced Deposition; FIB Milling; FIB-Fabricated AU; Focused Ion Beam; Gratings and Speckle Patterns FIB; Ion Beam Ething; Ion Beam Milling; Mass-Separated FIB; Nano-Needles FIB; Nanofabrication; Nanopatterning Thin Films FIB; Nanopore Arrays; Nanostructure; Nanowire-based Devices; Patterning Graphene Nanostructures; Single Nanopores; C; Nanotechnology; Semiconductors; Microsystems and MEMS; Nanochemistry; Nanophysics; Optical Materials; Chemistry and Materials Science; Elektronische Geräte und Materialien; Elektronik; Nanowissenschaften; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Technische Anwendung von elektronischen, magnetischen, optischen Materialien; BB
reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers' interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future development of materials science, energy technology, and electronic devices. The book can be recommended for physics, electrical engineering, and materials science departments as a reference on materials science and device design.
FIB Nanostructuresfocused ion beam in piezoelectric nanostructures.- Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures.- Chapter 19: Nanostructures by mass-separated FIB.- Index.
reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers' interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future development of materials science, energy technology, and electronic devices. The book can be recommended for physics, electric engineering, and materials science departments as a reference on materials science and device design.
FIB NanostructuresOffers comprehensive coverage of novel nanostructures fabricated by focused ion beam Provides the keys to understanding the emerging area of FIB nanostructures Written by leading experts in each research area Describes a key enabling technology forming a bridge between materials science research and the development of energy-related and other electronic devices
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