Scanning Probe Microscopy | Atomic Force Microscopy and Scanning Tunneling Microscopy | Bert Voigtländer | Buch | NanoScience and Technology | HC runder Rücken kaschiert | XV | Englisch | 2015 - gebunden oder broschiert
2015, ISBN: 9783662452394
[ED: Gebunden], [PU: Springer Berlin], This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the read… Mehr…
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Scanning Probe Microscopy / Atomic Force Microscopy and Scanning Tunneling Microscopy / Bert Voigtländer / Buch / NanoScience and Technology / HC runder Rücken kaschiert / XV / Englisch / 2015 - gebunden oder broschiert
2015, ISBN: 9783662452394
[ED: Gebunden], [PU: Springer Berlin], This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the read… Mehr…
booklooker.de |
Scanning Probe Microscopy | Atomic Force Microscopy and Scanning Tunneling Microscopy | Bert Voigtländer | Buch | NanoScience and Technology | HC runder Rücken kaschiert | xv | Englisch | 2015 - gebunden oder broschiert
2015, ISBN: 9783662452394
[ED: Gebunden], [PU: Springer Berlin], This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the read… Mehr…
booklooker.de |
2023, ISBN: 9783662452394
[ED: Buch], [PU: Springer Berlin Heidelberg], Neuware - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is t… Mehr…
booklooker.de |
2015, ISBN: 9783662452394
*Scanning Probe Microscopy* - Atomic Force Microscopy and Scanning Tunneling Microscopy. Auflage 2015 / gebundene Ausgabe für 170.99 € / Aus dem Bereich: Bücher, Wissenschaft, Technik Med… Mehr…
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Scanning Probe Microscopy | Atomic Force Microscopy and Scanning Tunneling Microscopy | Bert Voigtländer | Buch | NanoScience and Technology | HC runder Rücken kaschiert | XV | Englisch | 2015 - gebunden oder broschiert
2015, ISBN: 9783662452394
[ED: Gebunden], [PU: Springer Berlin], This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the read… Mehr…
Voigtländer, Bert:
Scanning Probe Microscopy / Atomic Force Microscopy and Scanning Tunneling Microscopy / Bert Voigtländer / Buch / NanoScience and Technology / HC runder Rücken kaschiert / XV / Englisch / 2015 - gebunden oder broschiert2015, ISBN: 9783662452394
[ED: Gebunden], [PU: Springer Berlin], This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the read… Mehr…
Scanning Probe Microscopy | Atomic Force Microscopy and Scanning Tunneling Microscopy | Bert Voigtländer | Buch | NanoScience and Technology | HC runder Rücken kaschiert | xv | Englisch | 2015 - gebunden oder broschiert
2015
ISBN: 9783662452394
[ED: Gebunden], [PU: Springer Berlin], This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the read… Mehr…
2023, ISBN: 9783662452394
[ED: Buch], [PU: Springer Berlin Heidelberg], Neuware - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is t… Mehr…
2015, ISBN: 9783662452394
*Scanning Probe Microscopy* - Atomic Force Microscopy and Scanning Tunneling Microscopy. Auflage 2015 / gebundene Ausgabe für 170.99 € / Aus dem Bereich: Bücher, Wissenschaft, Technik Med… Mehr…
Bibliographische Daten des bestpassenden Buches
Autor: | |
Titel: | |
ISBN-Nummer: |
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Detailangaben zum Buch - Scanning Probe Microscopy
EAN (ISBN-13): 9783662452394
ISBN (ISBN-10): 3662452391
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2015
Herausgeber: Springer Berlin Heidelberg
Buch in der Datenbank seit 2014-10-10T10:02:05+02:00 (Berlin)
Detailseite zuletzt geändert am 2024-03-24T15:17:27+01:00 (Berlin)
ISBN/EAN: 9783662452394
ISBN - alternative Schreibweisen:
3-662-45239-1, 978-3-662-45239-4
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: voigt, else voigtländer
Titel des Buches: tunneling, scanning force microscopy, voigtländer, atomic, probe aufnahmen, voigtlaender
Daten vom Verlag:
Autor/in: Bert Voigtländer
Titel: NanoScience and Technology; Scanning Probe Microscopy - Atomic Force Microscopy and Scanning Tunneling Microscopy
Verlag: Springer; Springer Berlin
382 Seiten
Erscheinungsjahr: 2015-03-23
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Niederlande.
Sprache: Englisch
181,89 € (DE)
186,99 € (AT)
201,00 CHF (CH)
POD
XV, 382 p. 189 illus., 148 illus. in color.
BB; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Nanotechnologie; Verstehen; Industrielle Fertigung; Atomic Force Microscopy; Non-contact Atomic Force Microscopy; Scanning Probe Microscopy; Scanning Tunneling Microscopy; Scanning Tunneling Spectroscopy; Nanotechnology; Microsystems and MEMS; Condensed Matter Physics; Elektronik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); EA; BC
Introduction.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy.- Surface States.- Forces Between Tip and Sample.- Technical Aspects of Atomic force Microscopy (AFM).- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy.- Intermittent Contact Mode/Tapping Mode.- Mapping of Mechanical Properties Using Force-Distance Curves.- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy.- Noise in Atomic Force Microscopy.- Quartz Sensors in Atomic force Microscopy.- Scanning Tunneling Microscopy.- Scanning Tunneling Spectroscopy (STS).- Vibrational Spectroscopy with the STM.- Spectroscopy and Imaging of Surface States.- Building Nanostructures Atom by Atom.Presents the state-of-the-art in scanning probe techniques Combines basic physical principles and their application to scanning tunneling and atomic force microscopes Useful study text for graduate students and also useful reference to researchers Includes supplementary material: sn.pub/extras
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