X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research (Springer Tracts in Modern Physics) - gebunden oder broschiert
1999, ISBN: 3540651829
[EAN: 9783540651826], Gebraucht, wie neu, [PU: Springer], Like New, Books
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X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research (Springer Tracts in Modern Physics) - gebunden oder broschiert
1999, ISBN: 9783540651826
Springer, 1999-04-15. Hardcover. Good., Springer, 1999-04-15, 2.5
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ISBN: 9783540651826
Springer, 1999. 1st. New., Springer, 1999, 6
Biblio.co.uk |
Biblio.co.uk |
1999, ISBN: 3540651829
[EAN: 9783540651826], [PU: Springer], pp. 197, Books
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X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research (Springer Tracts in Modern Physics) - gebunden oder broschiert
1999, ISBN: 3540651829
[EAN: 9783540651826], Gebraucht, wie neu, [PU: Springer], Like New, Books
Metin Tolan:
X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research (Springer Tracts in Modern Physics) - gebunden oder broschiert1999, ISBN: 9783540651826
Springer, 1999-04-15. Hardcover. Good., Springer, 1999-04-15, 2.5
ISBN: 9783540651826
Springer, 1999. 1st. New., Springer, 1999, 6
1999, ISBN: 3540651829
[EAN: 9783540651826], [PU: Springer], pp. 197, Books
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Detailangaben zum Buch - X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research (Springer Tracts in Modern Physics)
EAN (ISBN-13): 9783540651826
ISBN (ISBN-10): 3540651829
Gebundene Ausgabe
Erscheinungsjahr: 1999
Herausgeber: Springer
Buch in der Datenbank seit 2007-11-02T10:18:29+01:00 (Berlin)
Detailseite zuletzt geändert am 2022-12-08T12:44:44+01:00 (Berlin)
ISBN/EAN: 3540651829
ISBN - alternative Schreibweisen:
3-540-65182-9, 978-3-540-65182-6
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: metin tolan
Titel des Buches: ray physics, research film, physics thin films, springer tracts modern physics, modern physics from, ray scattering from soft matter thin films materials science and basic research
Daten vom Verlag:
Autor/in: Metin Tolan
Titel: Springer Tracts in Modern Physics. Ergebnisse der exakten Naturwissenschaften; X-Ray Scattering from Soft-Matter Thin Films - Materials Science and Basic Research
Verlag: Springer; Springer Berlin
198 Seiten
Erscheinungsjahr: 1998-11-26
Berlin; Heidelberg; DE
Gedruckt / Hergestellt in Deutschland.
Gewicht: 0,480 kg
Sprache: Englisch
85,59 € (DE)
87,99 € (AT)
106,60 CHF (CH)
Not available, publisher indicates OP
BB; Book; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Materialwissenschaft; Verstehen; surface; materials science; polymer; thin films; scattering; B; Surfaces and Interfaces, Thin Films; Physics and Astronomy; Soft and Granular Matter, Complex Fluids and Microfluidics; Solid State Physics; Spectroscopy and Microscopy; Oberflächenchemie und Adsorption; Materialwissenschaft / Aggregatzustände; Spektroskopie, Spektrochemie, Massenspektrometrie; Spektroskopie, Spektrochemie, Massenspektrometrie; Wissenschaftliche Ausstattung, Experimente und Techniken; BC; EA
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.- Comprehensive introduction to the state of the art of this rapidly growing research field.
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