Surface Analysis by Auger and x-Ray Photoelectron Spectroscopy - gebunden oder broschiert

This book is the first comprehensive treatment of the subject for over 10 years, during which time there have been many advances in instrumentation and performance, understanding of electron spectroscopy fundamentals, experimental methodology and data interpretation, which have markedly enhanced the capabilities of AES and XPS. This new information is now integrated into a thoroughly up-to-date reference volume for the benefit of researcher and practical analyst alike. 31 chapters cover the following areas; Perspectives and history Basic principles and spectral features Instrumentation, sample handling and beam effects electron transport and surface sensitivity Quantification Spectral interpretation and structural effects Depth profiling Imaging Developing aspects Extensive appendices of reference data. The authors are all internationally recognised and come from Australia, Europe, Japan and the USA.