The Engineering Handbook (Electrical Engineering Handbook)
- gebunden oder broschiert2004, ISBN: 9780849315862
Editor: Dorf, Richard C. Contributor: Furr, A. Keith, Contributor: Kreith, Frank, Contributor: Martin, R. Bruce, Contributor: Singh, R. Paul, Contributor: Singh, Vijay P. Contributor: Sha… Mehr…
Editor: Dorf, Richard C. Contributor: Furr, A. Keith, Contributor: Kreith, Frank, Contributor: Martin, R. Bruce, Contributor: Singh, R. Paul, Contributor: Singh, Vijay P. Contributor: Shackelford, James F. Contributor: Sonntag, Richard E. Contributor: Chapman, William L. Contributor: Bahill, A. Terry, Contributor: Hauser, Barbara, Contributor: Horan, Stephen, Contributor: Bhushan, Bharat, Contributor: Gallagher, Richard S. Contributor: Chen, Wai-Kai, Contributor: Poularikas, Alexander D. Contributor: Neudorfer, Paul, Contributor: Rajashekara, Kaushik S. Contributor: Steadman, John W. Contributor: Smith, Rosemary L. Contributor: Orlando, Terry P. Contributor: Sandige, Richard S. Contributor: Oklobdzija, Vojin G. Contributor: Brogan, William L. Contributor: Sage, Andrew P. Contributor: Hsia, T. C. Contributor: Spitzer, Cary R. Contributor: Lebeck, Alan O. Contributor: Ciletti, Michael D. Contributor: Smith, L. Montgomery, Contributor: Delleur, Jacques W. Contributor: Wood, William L. Contributor: Jacko, Robert B. Contributor: Johnson, Steven D. Contributor: Bethel, Jim, Contributor: Sinha, Kumares C. Contributor: Ruegg, Rosalie T. Contributor: Hecklinger, Roger S. Contributor: Anagnos, Thalia, Contributor: Tullis, J. Paul, Contributor: Boehm, Robert F. Contributor: Cain, George, Contributor: Timmerhaus, Klaus, Contributor: Hess, Ronald A. Contributor: Tong, Y. L. Contributor: Agarwal, Ramesh K. Contributor: Alley, F. Chris, Contributor: Ames, William F. Contributor: Amirtharajah, Appiah, Contributor: Amrhein, James E. Contributor: Anderson, T. L. Contributor: Arndt, Roger E. A. Contributor: Au, Tung, Contributor: Baird, Terrence W. Contributor: Barron, Randall F. Contributor: Bauld Jr., Nelson R. Contributor: Bayazitoglu, Yildiz, Contributor: Beaves, Robert G. Contributor: Beck, Paul A. Contributor: Bennett, Richard C. Contributor: Bhattacharya, Pallab, Contributor: Biltoft, Peter Jon, Contributor: Blanchard, Benjamin S. Contributor: Braun, Edwin R. Contributor: Breyer, Donald E. Contributor: Broadwater, Robert, Contributor: Buchanan, George R. Contributor: Cabrera, Luis-Felipe, Contributor: Chavez, James M. Contributor: Chen, Peter M. Contributor: Cook, William J. Contributor: Cooke, David H. Contributor: Corder, William C. Contributor: Cota, Harold M. Contributor: Cropley, J. B. Contributor: Daigle, John N. Contributor: Das, Braja M. Contributor: DeWitt, Bon A. Contributor: Domingos, Henry, Contributor: Donovan, John F. Contributor: Doraiswamy, Deepak, Contributor: Dorny, C. Nelson, Contributor: Duff, William G. Contributor: Dyer, Steven A. Contributor: Edwards, William M. Contributor: El-Wakil, Mohammed M. Contributor: Fabrycky, Wolter J. Contributor: Fair, James R. Contributor: Fazzi, Charles, Contributor: Fogler, H. Scott, Contributor: Fordyce, Samuel W. Contributor: Fowler, Wallace Thomas, Contributor: Freitas, Rich, Contributor: Gere, James M. Contributor: Gergely, Peter, Contributor: Goldschmidt, Victor W. Contributor: Grantham, Walter J. Contributor: Hale, Francis Joseph, Contributor: Hamann, Jerry C. Contributor: Harrison, Steve J. Contributor: Hendrickson, Chris, Contributor: Herbich, John B. Contributor: Hibbeler, Russell C. Contributor: Hill, Fredrick J. Contributor: Hills, David J. Contributor: Hoffman, Joe D. Contributor: Hurst, Paul J. Contributor: Inman, Daniel J. Contributor: Johansson, Rolf, Contributor: June, Reid R. Contributor: Karnopp, Bruce H. Contributor: Karwowski, Waldemar, Contributor: Kiefer, Ralph W. Contributor: Kmec, Joseph F. Contributor: Knod Jr., Edward M. Contributor: Kornhauser, Alan A. Contributor: Koros, William J. Contributor: Krantz, William B. Contributor: Kraus, Alan D. Contributor: Kusiak, Andrew, Contributor: Kyle, Benjamin G. Contributor: Lahey Jr., Richard T. Contributor: Langston, Lee S. Contributor: Leissa, Arthur W. Contributor: Lin, K. H. Contributor: Lior, Noam, Contributor: Marlin, Thomas E. Contributor: Marshall, Harold E. Contributor: Matthys, Eric F. Contributor: McCarthy, J. Michael, Contributor: McCormac, Jack, Contributor: McDonald, Alan T. Contributor: Mendelsohn, Daniel A. Contributor: Meriam, J. L. Contributor: Meyer, Michael D. Contributor: Monk, Jan C. Contributor: Mourad, Samiha, Contributor: Moustafa, Safwat M. A. Contributor: Munson, Bruce R. Contributor: Nawy, Edward G. Contributor: Nise, Norman, Contributor: Ohadi, Michael, Contributor: Opdyke Jr., George, Contributor: Ovunc, Bulent A. Contributor: Palais, Joseph, Contributor: Peavy, Howard S. Contributor: Pennock, Gordon R. Contributor: Pilkey, Walter D. Contributor: Poling, Bruce E. Contributor: Poor, H. Vincent, Contributor: Rahimi, Mansour, Contributor: Ramakumar, Rama, Contributor: Rappaport, Theodore S. Contributor: Rashid, Muhammad H. Contributor: Raven, Francis H. Contributor: Ravindra, M . K. Contributor: Reinhold, Timothy A. Contributor: Richards, John L. Contributor: Richardson, E. V. Contributor: Risbud, Subhash H. Contributor: Rosa, Albert J. Contributor: Sandler, Stanley I. Contributor: Schonberger, Richard J. Contributor: Schonfeld, Paul M. Contributor: Segui, William T. Contributor: Sexsmith, Robert G. Contributor: Sherif, S.A. Contributor: Shibayama, George, Contributor: Shin, Yung C. Contributor: Short, Walter D. Contributor: Shuldiner, Paul W. Contributor: Sircar, Shivaji, Contributor: Soclof, Sidney, Contributor: Soderstrand, Michael A. Contributor: Subramanyan, P. K. Contributor: Svoboda, James, Contributor: Swanson, Larry W. Contributor: Swift, Andrew, Contributor: Thamhain, Hans J. Contributor: Thompson, James F. Contributor: Van Brunt, Vincent, Contributor: van Gelder, Boudewijn H. W. Contributor: Vincent, Thomas L. Contributor: Volpano, Dennis M. Contributor: Wilkinson, Barry, Contributor: Wu, William W. Contributor: Zachary, Loren W. Contributor: Zeid, Ashraf A. Contributor: Ziemer, Rodger E. Contributor: Kitis, Levent, Contributor: Walker, David R. B. Contributor: Leonard II, John, Contributor: Owens, William, Contributor: Scavuzzo, Rudolph J. Contributor: Livingston, Earl, Contributor: Woodall, David M. Contributor: Oldshue, James Y. Contributor: Miller, Scott L. Contributor: Delin, Kevin A. Contributor: Falconer, John L. Contributor: McKinney, Ross E. Contributor: Beck, R. R. Contributor: Long, Gregory L. Contributor: Sill, Ben L. Contributor: Shipp, J. G. Contributor: Wang, Pao-lien, Contributor: Sathuvalli, Udaya B. Contributor: Woods, David G. Contributor: VanArsdall, Anne, Contributor: Franceschinis, Robert D. Contributor: Cooper, C. David, Contributor: Kim, Bang Mo, Contributor: Schimel, Boyd D. Contributor: Gehlen, Pierre, Contributor: Chiang, Shiao-Hung, Contributor: Stanek, E. Keith, Contributor: Bonitz, Robert G. Contributor: Wahlberg, Curtis J. Contributor: Haydt, Mary Sue, Contributor: Moroz, Emil, Contributor: Muhamed, Rias, Contributor: Doradla, Anil, Contributor: Meyer-Waarden, Karsten, Contributor: Lillesand, Thomas M. Contributor: Stephens, Matthew P. Contributor: Black, Kenneth B. Contributor: Borzilerii, Charles V. Contributor: Holten, David, Contributor: Traini, Matt, Contributor: Feng, Chang-Xue, Contributor: McNeil, Sue, Contributor: Bordas, Carol I. Contributor: Ligon, John B. Contributor: Jamaldin, Bill, Contributor: Couch II, Leon W. Contributor: Ravani, Bahram, Contributor: Buckner, R. Ben, Contributor: Sargent, Albert, Contributor: Lee, Robert E. Contributor: Orbey, Hasan, Contributor: Hanson, Simon P. Contributor: Kalinowski, Anthony J. Contributor: Wallenstein, David, Contributor: Shapiro, Andrew P. Contributor: Jackson, Thomas N. Contributor: Buehrer, R. Michael, Contributor: Mindell, David, Contributor: He, Daxin, Contributor: Cigic, Tony M. Contributor: Jones, S. Casey, Contributor: Deliu, Anca, Contributor: Bomar, Bruce W. Contributor: Sadiku, Matthew N.O. Contributor: Lui, E.M. Contributor: Arlinghaus, Sandra, Contributor: Jacquot, Raymond G. Contributor: Bronzino, Joseph D. Contributor: Sims, Ronald C. Contributor: Austin, Robert F. Contributor: Stephanedes, Yorgos J. Contributor: von Maltzahn, Wolf W. Contributor: Kreider, Jan F. Contributor: Wolff, Thomas, Contributor: Vieux, Baxter E. Contributor: Kurfess, Thomas R. Contributor: Piovoso, Michael J. Contributor: Stefani, Raymond T. Contributor: Bedient, Philip B. Contributor: Cronin, Dennis J. Contributor: Bishop, Robert H. Contributor: Scawthorn, Charles, Contributor: Ayyub, Bilal M. Contributor: Harr, Milton E. Contributor: Blackwell, Glenn R. Contributor: Laplante, Philip A. Contributor: Skvarenina, Timothy L. Contributor: Golio, Mike, Contributor: Guan, Ling, Contributor: Dieck, Ronald H. Contributor: Eren, Halit, Contributor: Baukal Jr., Charles E. Contributor: Husain, Iqbal, Contributor: Ozbay, Hitay, Contributor: Messenger, Roger, Contributor: Banerjee, Partha P. Contributor: Attia, John Okyere, Contributor: Krarti, Moncef, Contributor: Lyshevski, Sergey Edward, Contributor: Wang, Yingxu, Contributor: ElAli, Taan S. Contributor: Hoogers, Gregor, Contributor: Naidu, D. Subbaram, Contributor: Yang, Chih-Kong Ken, Contributor: Varman, Peter J. Contributor: Hughes, Michael Pycraft, Contributor: Spellman, Frank R. Contributor: Chattopadhyay, Somnath, Contributor: Relf, Christopher G. Contributor: Palsberg, Jens, Contributor: Ochterbeck, Jay M. Contributor: Baird, Rex, Contributor: Hazelwood, Scott J. Contributor: Nagurka, Mark L. Contributor: Birn, Stephen M. Contributor: Heaberlin, Scott W. Contributor: Akujuobi, Cajetan M. Contributor: Chinowsky, Timothy M. Contributor: Feng, C. Jack, Contributor: Serrani, Andrea, Contributor: Duman, Tolga M. Contributor: Maitra, Arindam, Contributor: Phipps, Kermit, Contributor: Gaikwad, Anish Madhukar, Contributor: Moore, Theodore T. Contributor: Damle, Shilpa, Contributor: Wallace, David W. Contributor: Ghajar, Afshin J. Contributor: Rabinowitz, David, Contributor: Oguzmert, Metin, Contributor: Hazelton, Nicholas Willia, Contributor: Sarigul-Klijn, Nesrin, Contributor: Mancini, Thomas R. Contributor: Jonas, Otakar, Contributor: Steele, John Patrick, Contributor: Wetzel, Kyle K. Contributor: Hoettges, Kai F. Contributor: Labeed, Fatima Hanna, Contributor: Fatoyinbo, Henry Oluseyi, Contributor: Song, Charles Cheih S, Contributor: Ventre, Gerard G. Contributor: Tullis, Blake P. Contributor: Hoffberg, Steven M. Contributor: Nieman, Karl, Contributor: Randall, Jonathan, Contributor: Placencia, Greg, Contributor: Agard, Bruno, Contributor: Russell, Jennifer Lynn, Series Editor: Dorf, Richard C. CRC Press, Hardcover, Auflage: 2, 3080 Seiten, Publiziert: 2004-06-29T00:00:01Z, Produktgruppe: Book, 3.83 kg, Verkaufsrang: 2776547, Environmental, Civil Engineering, Engineering & Technology, Science, Nature & Maths, Subjects, Books, Mechanics, Electrical, Electronics Engineering, Electronics & Communications Engineering, Energy Technology, Mechanical & Materials Engineering, Reference, Mathematics, Electromagnetism, Physics, Energy Engineering, Scientific, Technical & Medical, Environmental Engineering, Mechanical & Material Engineering, Format: Illustrated, CRC Press, 2004<
